Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The OPTIMUS™ TKD detector head ...
insights from industryDr. Daniel GoranSr Product Manager Bruker Nano Analytics In this interview, Dr. Daniel Goran, Sr. Product Manager for EBSD at Bruker Nano Analytics talks to AZoM about the new ...
In-situ plasma cleaning is crucial to avoid gradual contamination of vacuum chamber surfaces and samples at the time of analysis and characterization of nanocrystalline materials and nanostructures. A ...
MapSweeper software revolutionizes EBSD analysis by overcoming traditional indexing limitations, enhancing accuracy and speed in materials characterization.
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