The high spatial resolutions of scanning electron microscopy (SEM) have proved invaluable in nanomaterial development, with the ability to resolve even single atoms on a surface. 1 The spatial ...
A focused ion beam scanning electron microscope (FIB-SEM) featuring a compact Time-of-Flight Secondary Ion Mass Spectrometer (ToF-SIMS) and a traditional microanalytical method of Energy Dispersive ...
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