UV-visible-NIR microspectroscopic analysis of thin films on semiconductor wafers is one of the most common applications of the technique. In the UV-visible-NIR range, the interference spectra can be ...
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The color mapping of in situ UV-vis reflectance spectra as a function of spin-coating time for PM6:Y6 blends with DIO (a) and with TCB (b). Normalized in situ absorption intensity at the wavelength of ...
CRAIC Technologies, introduces the automated version of its flagship product: the 20/20 Perfect Vision™ UV-visible-NIR microspectrophotometer. This system is designed to be fully programmable with ...
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