Known-good-die (KGD) sort is a commonly used technique in semiconductor processing that allows IC device engineers to bypass the packaging of defective semiconductor devices, saving time and money.
The MEMS industry is growing rapidly, but early testing is still much neglected. At a glance, manufacturing MEMS devices and classic ICs seem quite similar, but the behavior of MEMS devices is much ...
Aehr Test Systems, a leading provider of wafer level and package level automated test systems, has reported another impressive quarter in its fiscal year 2026. The company's strong momentum across ...
FREMONT, Calif., Dec. 07, 2022 (GLOBE NEWSWIRE) -- Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor production test and reliability qualification equipment, today announced it ...
FREMONT, Calif., March 30, 2023 (GLOBE NEWSWIRE) -- Aehr Test Systems (AEHR), a worldwide supplier of semiconductor test and reliability qualification equipment, today announced financial results for ...
NORTH READING, Mass.--(BUSINESS WIRE)-- Teradyne, a leading provider of automated test equipment, has partnered with ficonTEC, a global leader in production solutions for photonics assembly and test, ...
Although it requires a new generation of test equipment, testing MEMS devices is challenging but not impossible. Since the early days of the IC industry, wafer-level test has been possible using ...
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