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SSR Latching Switch Circuit Using Push Buttons

Hi, I'm Bill. I'm a software developer with a passion for making and electronics. I do a lot of things and here is where I ...
IEEE

MURLAV: A Multiple-Node-Upset Recovery Latch and Algorithm-Based Verification Method

Abstract: In advanced CMOS technologies, integrated circuits are sensitive to multiple-node-upsets (MNUs) induced in harsh radiation environments. The existing verification of the reliability of ...
IEEE

Single-Event Upset Monitor-Based Radiation-Hardened Latch for Multi-Node Upset

Abstract: This brief describes a novel latch design, the Single-Event Upset (SEU) monitoring-based Radiation Hardened Latch (SMRHL), which is robust under multi-node upset (MNU) conditions. The SEU ...